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    Defects in SiO2 and Related Dielectrics: Science and Technology (NATO Science Series II: Mathematics, Physics and Chemistry, 2, Band 2)

     
    Defects in SiO2 and Related Dielectrics: Science and Technology (NATO Science Series II: Mathematics, Physics and Chemistry, 2, Band 2)

    Description

    Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.
    This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

    Product details

    EAN/ISBN:
    9780792366850
    Edition:
    2000
    Format:
    Illustriert
    Medium:
    Bound edition
    Number of pages:
    632
    Publication date:
    2000-12-31
    Publisher:
    Springer
    EAN/ISBN:
    9780792366850
    Edition:
    2000
    Format:
    Illustriert
    Medium:
    Bound edition
    Number of pages:
    632
    Publication date:
    2000-12-31
    Publisher:
    Springer

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