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Applied Scanning Probe Methods IX: Characterization (NanoScience and Technology)

 
Applied Scanning Probe Methods IX: Characterization (NanoScience and Technology)

Description

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.

Product details

EAN/ISBN:
9783540740827
Edition:
2008
Medium:
Bound edition
Number of pages:
387
Publication date:
2008-01-08
Publisher:
Springer
Languages:
english
EAN/ISBN:
9783540740827
Edition:
2008
Medium:
Bound edition
Number of pages:
387
Publication date:
2008-01-08
Publisher:
Springer
Languages:
english

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