cartcart

    Applied Scanning Probe Methods IX: Characterization (NanoScience and Technology)

     
    Applied Scanning Probe Methods IX: Characterization (NanoScience and Technology)

    Description

    The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.

    Product details

    EAN/ISBN:
    9783540740827
    Edition:
    2008
    Medium:
    Bound edition
    Number of pages:
    387
    Publication date:
    2008-01-08
    Publisher:
    Springer
    Languages:
    english
    EAN/ISBN:
    9783540740827
    Edition:
    2008
    Medium:
    Bound edition
    Number of pages:
    387
    Publication date:
    2008-01-08
    Publisher:
    Springer
    Languages:
    english

    Shipping

    laposte
    The edition supplied may vary.
    Currently sold out

    Recommended for you