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Measurement of seeded defect width in the bearing using Sym5 wavelet

 
Measurement of seeded defect width in the bearing using Sym5 wavelet

Description

This book is a great source for those who are working in the field of condition monitoring. Identifying the high frequency events in a signal is comparatively easy but this book elaborates about to spotting low frequency in detail which could be great source for the researchers working in this field. In addition, this book is an extract of different types of techniques being used in the field of condition monitoring.

Product details

EAN/ISBN:
9783330087262
Medium:
Paperback
Number of pages:
168
Publication date:
2017-05-18
Publisher:
LAP LAMBERT Academic Publishing
EAN/ISBN:
9783330087262
Medium:
Paperback
Number of pages:
168
Publication date:
2017-05-18
Publisher:
LAP LAMBERT Academic Publishing

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